Accounting for Current Degradation Effects in the Compact Noise Modeling of Nano-scale MOSFETs - IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation Access content directly
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hal-03876798 , version 1 (28-11-2022)

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Angeliki Tataridou, Christoforos Theodorou. Accounting for Current Degradation Effects in the Compact Noise Modeling of Nano-scale MOSFETs. 2022 11th International Conference on Modern Circuits and Systems Technologies (MOCAST), Jun 2022, Bremen, Germany. pp.1-4, ⟨10.1109/MOCAST54814.2022.9837755⟩. ⟨hal-03876798⟩
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