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Influence of the bulk electrode on the characteristics and the channel noise of SOS-MOS transistors

D. Rigaud , D. Sodini , André Touboul , J.-C. Lopez , G. Lecoy et al.
Revue de Physique Appliquée, 1980, 15 (5), pp.937-940. ⟨10.1051/rphysap:01980001505093700⟩
Journal articles istex jpa-00244808v1
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Trap characterization in S. O. S. - M. O. S. transistors using noise measurements

André Touboul , G. Pelloux , G. Lecoy , A.A. Choujaa , P. Gentil et al.
Revue de Physique Appliquée, 1978, 13 (5), pp.227-231. ⟨10.1051/rphysap:01978001305022700⟩
Journal articles istex jpa-00244445v1
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HOT CARRIERS IN REDUCED GEOMETRY SURFACE-CHANNEL CHARGE-COUPLED DEVICES

André Touboul , J. Lopez , G. Lecoy
Journal de Physique Colloques, 1981, 42 (C7), pp.C7-183-C7-192. ⟨10.1051/jphyscol:1981721⟩
Journal articles istex jpa-00221658v1