Filter your results
- 3
- 24
- 3
- 3
- 1
- 1
- 1
- 3
- 3
- 3
- 3
- 3
- 1
- 1
- 1
- 1
- 1
- 1
- 1
|
|
sorted by
|
|
Influence of the bulk electrode on the characteristics and the channel noise of SOS-MOS transistorsRevue de Physique Appliquée, 1980, 15 (5), pp.937-940. ⟨10.1051/rphysap:01980001505093700⟩
Journal articles
istex
jpa-00244808v1
|
||
|
Trap characterization in S. O. S. - M. O. S. transistors using noise measurementsRevue de Physique Appliquée, 1978, 13 (5), pp.227-231. ⟨10.1051/rphysap:01978001305022700⟩
Journal articles
istex
jpa-00244445v1
|
||
|
HOT CARRIERS IN REDUCED GEOMETRY SURFACE-CHANNEL CHARGE-COUPLED DEVICESJournal de Physique Colloques, 1981, 42 (C7), pp.C7-183-C7-192. ⟨10.1051/jphyscol:1981721⟩
Journal articles
istex
jpa-00221658v1
|