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Article Dans Une Revue Journal of Crystal Growth Année : 1998

Interface roughness correlation in CdTe/CdZnTe strained quantum wells

Résumé

In CdTe/CdZnTe strained quantum wells (QWs) the exciton inhomogeneous linewidth decreases with decreasing QW width. We interpret this unusual behaviour as a manifestation of the fact that the two QW heterointerfaces are increasingly correlated for narrow QWs, resulting in reduced well width fluctuation along the QW plane. Small incidence angle X-ray diffraction experiments confirm this interpretation.

Dates et versions

hal-01876868 , version 1 (18-09-2018)

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N. Pelekanos, N. Boudet, J. Eymery, H. Mariette. Interface roughness correlation in CdTe/CdZnTe strained quantum wells. Journal of Crystal Growth, 1998, 184-185, pp.886 - 889. ⟨10.1016/S0022-0248(98)80185-1⟩. ⟨hal-01876868⟩
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