Selective defect in antigen-induced TCR internalization at the immune synapse of CD8 T cells bearing the ZAP-70 (Y292F) mutation. - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue Journal of Immunology Année : 2005

Selective defect in antigen-induced TCR internalization at the immune synapse of CD8 T cells bearing the ZAP-70 (Y292F) mutation.

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Immunologie
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Dates et versions

hal-00080072 , version 1 (14-06-2006)

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  • HAL Id : hal-00080072 , version 1

Citer

S. Davanture, J. Leignadier, P. Milani, Pierre Soubeyran, Bernard Malissen, et al.. Selective defect in antigen-induced TCR internalization at the immune synapse of CD8 T cells bearing the ZAP-70 (Y292F) mutation.. Journal of Immunology, 2005, 175, pp.3140-3149. ⟨hal-00080072⟩

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