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Article Dans Une Revue Journal of Applied Physics Année : 2008

Finite element modeling for temperature stabilization of gated Hall sensors

Benoit Jouault
Sylvie Contreras
A. Kerlain
  • Fonction : Auteur
Vincent Mosser
  • Fonction : Auteur

Résumé

Using finite element analysis, we have calculated the Hall voltage of gated Hall sensors in the temperature range (−55 °C, 125 °C). We investigated how both the sensor shape and the external connections influence the Hall voltage and its thermal drift. The numerical results are in excellent agreement with the experimental measurements. By contrast, we checked that simplified analytical methods lead to a large numerical error, which is not acceptable in these sensors devoted to metrological applications. In particular, it is found that the thermal drift in the Hall voltage can be canceled for a current of the order of 300 µA, a much higher value than that predicted by the corresponding analytical calculations.
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Dates et versions

hal-00388502 , version 1 (26-05-2009)

Identifiants

Citer

Benoit Jouault, L. Bouguen, Sylvie Contreras, A. Kerlain, Vincent Mosser. Finite element modeling for temperature stabilization of gated Hall sensors. Journal of Applied Physics, 2008, 104 (5), pp.053705. ⟨10.1063/1.2968436⟩. ⟨hal-00388502⟩
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