Recovering Functional Properties of Solution Processed Silicon Thin-Films Symposium R on Advanced Inorganic Materials and Concepts for Photovoltaics/Spring Meeting of the European-Materials-Research-Society - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue Energy Procedia Année : 2011

Recovering Functional Properties of Solution Processed Silicon Thin-Films Symposium R on Advanced Inorganic Materials and Concepts for Photovoltaics/Spring Meeting of the European-Materials-Research-Society

Résumé

Solution processed technologies are more and more used to lower the manufacturing prices in solar cell industry. This paper shows that silicon nanoparticles dispersion has the potential to be used as raw material for microcrystalline silicon thin-film thus opening a route for solution processed silicon devices. Restoring of functional properties of deposited film by classical thermal annealing and microwave annealing is led. Both recovering techniques are studied in terms of morphology as well as electrical and optical properties. Surface chemistry of the nanoparticles is shown to have a major role on the stability of the dispersion, the deposition and sintering processes. (C) 2011 Published by Elsevier Ltd. Selection and/or peer-review under responsibility of the Organizers of European Materials Research Society (EMRS) Conference: Symposium on Advanced Inorganic Materials and Concepts for Photovoltaics.

Domaines

Matériaux

Dates et versions

hal-00850938 , version 1 (09-08-2013)

Identifiants

Citer

Etienne Drahi, Sylvain Blayac, Sébastien Saunier, François Valdivieso, Marie-Claude Bartholin, et al.. Recovering Functional Properties of Solution Processed Silicon Thin-Films Symposium R on Advanced Inorganic Materials and Concepts for Photovoltaics/Spring Meeting of the European-Materials-Research-Society. Energy Procedia, 2011, 10, pp.144-148. ⟨10.1016/j.egypro.2011.10.167⟩. ⟨hal-00850938⟩
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