X-ray resonant single-crystal diffraction technique, a powerful tool to investigate the kesterite structure of the photovoltaic Cu2ZnSnS4 compound. - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue Materials Science and Engineering: B Année : 2014

X-ray resonant single-crystal diffraction technique, a powerful tool to investigate the kesterite structure of the photovoltaic Cu2ZnSnS4 compound.

Résumé

Cu/Zn disorder in the kesterite Cu2ZnSnS4 derivatives used for thin film based solar cells is an important issue for photovoltaic performances. Unfortunately, Cu and Zn cannot be distinguished by conventional laboratory X-ray diffraction. This paper reports on a resonant diffraction investigation of a Cu2ZnSnS4 single crystal from a quenched powdered sample. The full disorder of Cu and Zn in the z = 1/4 atomic plane is shown. The structure, namely disordered kesterite, is then described in the I\bar 42m space group.
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Dates et versions

hal-00988806 , version 1 (09-05-2014)

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Alain Lafond, Leo Choubrac, Catherine Guillot-Deudon, Pierre Fertey, Michel Evain, et al.. X-ray resonant single-crystal diffraction technique, a powerful tool to investigate the kesterite structure of the photovoltaic Cu2ZnSnS4 compound.. Materials Science and Engineering: B, 2014, 70 (2), pp.390. ⟨10.1107/S2052520614003138⟩. ⟨hal-00988806⟩
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