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Poster De Conférence Année : 2015

On the behavior of electrically stressed Ti/TiOx/Ti junctions fabricated by local anodic oxidation

Nicolas Guillaume
Etienne Puyoo
M. Le Berre
David Albertini
Nicolas Baboux
Céline Chevalier
Brice Gautier
Francis Calmon
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Dates et versions

hal-01489627 , version 1 (14-03-2017)

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  • HAL Id : hal-01489627 , version 1

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Nicolas Guillaume, Etienne Puyoo, M. Le Berre, David Albertini, Nicolas Baboux, et al.. On the behavior of electrically stressed Ti/TiOx/Ti junctions fabricated by local anodic oxidation. On the behavior of electrically stressed Ti/TiOx/Ti junctions fabricated by local anodic oxidation, 2015, Lille, France. 2015. ⟨hal-01489627⟩
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