Experimental scaling of plane-Born cross sections and ab initio assignments for electron-impact excitation and dissociation of XF 4 (X = C, Si, and Ge) molecules - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue Journal of Chemical Physics Année : 2017

Experimental scaling of plane-Born cross sections and ab initio assignments for electron-impact excitation and dissociation of XF 4 (X = C, Si, and Ge) molecules

Fichier non déposé

Dates et versions

hal-01634259 , version 1 (13-11-2017)

Identifiants

Citer

Denis Duflot, M. Hoshino, P. Limão-Vieira, S. Ohtomi, H. Tanaka. Experimental scaling of plane-Born cross sections and ab initio assignments for electron-impact excitation and dissociation of XF 4 (X = C, Si, and Ge) molecules. Journal of Chemical Physics, 2017, 146 (14), ⟨10.1063/1.4979299⟩. ⟨hal-01634259⟩
90 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More