Combined EELS, LEED and SR-XPS study of ultra-thin crystalline layers of indium nitride on InP(100)—Effect of annealing at 450°C - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue Applied Surface Science Année : 2007

Combined EELS, LEED and SR-XPS study of ultra-thin crystalline layers of indium nitride on InP(100)—Effect of annealing at 450°C

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hal-01827628 , version 1 (02-07-2018)

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Christine Robert-Goumet, M. Petit, L. Bideux, B. Gruzza, G. Monier, et al.. Combined EELS, LEED and SR-XPS study of ultra-thin crystalline layers of indium nitride on InP(100)—Effect of annealing at 450°C. Applied Surface Science, 2007, 253 (9), pp.4445 - 4449. ⟨10.1016/j.apsusc.2006.09.067⟩. ⟨hal-01827628⟩
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