Functions classification approach to generate reconfigurable fine-grain logic based on Ambipolar Independent Double Gate FET (Am-IDGFET) - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue Microelectronics Journal Année : 2013

Functions classification approach to generate reconfigurable fine-grain logic based on Ambipolar Independent Double Gate FET (Am-IDGFET)

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hal-02060710 , version 1 (07-03-2019)

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K. Jabeur, Ian O'Connor, N. Yakymets. Functions classification approach to generate reconfigurable fine-grain logic based on Ambipolar Independent Double Gate FET (Am-IDGFET). Microelectronics Journal, 2013, 44 (12), pp.1316-1327. ⟨10.1016/j.mejo.2013.09.001⟩. ⟨hal-02060710⟩
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