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Communication Dans Un Congrès Année : 2019

Study of the Radiated Immunity of an Op-Amp Using Near Field Scan Immunity Method

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hal-02515677 , version 1 (23-03-2020)

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  • HAL Id : hal-02515677 , version 1

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A. Durier, S. Ben Dhia, T. Dubois. Study of the Radiated Immunity of an Op-Amp Using Near Field Scan Immunity Method. Proceedings of EMC Compo, 2019, 2019, Hangzhou, China. ⟨hal-02515677⟩
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