Importance and Requirement of frequency band specific RF probes EM Models in sub-THz and THz Measurements up to 500 GHz - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue IEEE Transactions on Terahertz Science and Technology Année : 2020

Importance and Requirement of frequency band specific RF probes EM Models in sub-THz and THz Measurements up to 500 GHz

Résumé

In this paper, we present on-silicon structures on-wafer measurements up to 500 GHz and a comprehensive electromagnetic (EM) simulation analysis to understand non-ideal behaviour in the measured data. The EM simulations are performed in such a way that the simulation setup remains very close to the physical measurement environment where a faithful true EM model of the RF probes is an essential requirement. In this process, four different RF probes used during measurements in the frequency bands 1 GHz-110 GHz, 140 GHz-220 GHz, 220 GHz-325 GHz and 325 GHz-500 GHz are designed in the EM simulator. We also highlight the importance of the frequency band specific probe models to develop a deep understanding of the problems encountered in the sub-THz and THz measurements.
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Dates et versions

hal-02884144 , version 1 (29-06-2020)

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Chandan Yadav, Marina Deng, Sebastien Fregonese, Marco Cabbia, Magali de Matos, et al.. Importance and Requirement of frequency band specific RF probes EM Models in sub-THz and THz Measurements up to 500 GHz. IEEE Transactions on Terahertz Science and Technology, In press, pp.1-1. ⟨10.1109/TTHZ.2020.3004517⟩. ⟨hal-02884144⟩
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