Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron–ion imaging - Archive ouverte HAL Access content directly
Journal Articles Journal of Physics B: Atomic, Molecular and Optical Physics Year : 2020

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hal-03005114 , version 1 (13-11-2020)

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A Comby, E Bloch, S Beauvarlet, D Rajak, S Beaulieu, et al.. Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron–ion imaging. Journal of Physics B: Atomic, Molecular and Optical Physics, 2020, 53 (23), pp.234003. ⟨10.1088/1361-6455/abbe27⟩. ⟨hal-03005114⟩
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