Journal Articles
Optics Express
Year : 2020
dominique ausserré : Connect in order to contact the contributor
https://cnrs.hal.science/hal-03053790
Submitted on : Friday, December 11, 2020-11:06:08 AM
Last modification on : Monday, November 6, 2023-12:08:32 PM
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Refahi Abou Khachfe, Dominique Ausserre. Backside absorbing layer microscopy: a universal relationship between physical thickness and reflectivity. Optics Express, 2020, 28 (4), pp.4836. ⟨10.1364/OE.28.004836⟩. ⟨hal-03053790⟩
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