Precise control of J eff = 1/2 magnetic properties in Sr 2 IrO 4 epitaxial thin films by variation of strain and thin film thickness
Résumé
We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff = 1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from
two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer
picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring
to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.
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