Precise control of J eff = 1/2 magnetic properties in Sr 2 IrO 4 epitaxial thin films by variation of strain and thin film thickness - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue Physical Review B Année : 2020

Precise control of J eff = 1/2 magnetic properties in Sr 2 IrO 4 epitaxial thin films by variation of strain and thin film thickness

Résumé

We report on a comprehensive investigation of the effects of strain and film thickness on the structural and magnetic properties of epitaxial thin films of the prototypal Jeff = 1/2 compound Sr2IrO4 by advanced x-ray scattering. We find that the Sr2IrO4 thin films can be grown fully strained up to a thickness of 108 nm. By using x-ray resonant scattering, we show that the out-of-plane magnetic correlation length is strongly dependent on the thin film thickness, but independent of the strain state of the thin films. This can be used as a finely tuned dial to adjust the out-of-plane magnetic correlation length and transform the magnetic anisotropy from two-dimensional to three-dimensional behavior by incrementing film thickness. These results provide a clearer picture for the systematic control of the magnetic degrees of freedom in epitaxial thin films of Sr2IrO4 and bring to light the potential for a rich playground to explore the physics of 5d transition-metal compounds.
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hal-03098516 , version 1 (11-08-2023)

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Stephan Geprägs, Björn Erik Skovdal, Monika Scheufele, Matthias Opel, Didier Wermeille, et al.. Precise control of J eff = 1/2 magnetic properties in Sr 2 IrO 4 epitaxial thin films by variation of strain and thin film thickness. Physical Review B, 2020, 102 (21), pp.214402. ⟨10.1103/PhysRevB.102.214402⟩. ⟨hal-03098516⟩
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