%0 Conference Paper %F Oral %T The individual thickness characterization of stacked sample by terahertz imaging %+ Georgia Tech Lorraine [Metz] %A Zhai, Min %A Locquet, A. %A Citrin, David, S. %< avec comité de lecture %Z TERAHERTZ %B 11th THz young scientist meeting %C Marburg, Germany %8 2020-03-01 %D 2020 %Z Engineering Sciences [physics]/Optics / PhotonicConference papers %G English %L hal-03477595 %U https://cnrs.hal.science/hal-03477595 %~ CNRS %~ UNIV-FCOMTE %~ CENTRALESUPELEC %~ UMI-GTL %~ TEST-HALCNRS