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Article Dans Une Revue Microelectronics Reliability Année : 2019

Destruction analyses of power supplies due to electric pulse

Résumé

This paper presents the effects of high amplitude conducted electromagnetic pulses on the electrical behaviour of a flyback switch-mode power supply. The electromagnetic pulse is injected using a Current Injection Platform (PIC, standing for “Plateforme d'Injection en Courant” in French) able to generate conducted electric pulses of several hundreds of amperes. Injections are performed in common mode and in differential mode until the power supply destruction. These destruction tests permit to show that common mode injection is more destructive than differential mode injection. Moreover, in most cases, it is shown that the same components are destroyed. Components analyses were performed and permit to make some hypotheses about their failure.
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Dates et versions

hal-03488481 , version 1 (21-12-2021)

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Paternité - Pas d'utilisation commerciale

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G. Mejecaze, T. Dubois, L. Curos, F. Puybaret, J.-M. Vinassa. Destruction analyses of power supplies due to electric pulse. Microelectronics Reliability, 2019, 100-101, pp.113470 -. ⟨10.1016/j.microrel.2019.113470⟩. ⟨hal-03488481⟩
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