%0 Journal Article %T Investigation of critical parameters in power supplies components failure due to electric pulse %+ Laboratoire de l'intégration, du matériau au système (IMS) %A Curos, L. %A Dubois, T. %A Mejecaze, G. %A Puybaret, F. %A Plano, B. %A Vinassa, J.-M. %@ 0026-2714 %J Microelectronics Reliability %I Elsevier %V 114 %P 113936 - %8 2020-11-30 %D 2020 %R 10.1016/j.microrel.2020.113936 %Z Engineering Sciences [physics]Journal articles %G English %2 https://hal.science/hal-03493510/document %2 https://hal.science/hal-03493510/file/S0026271420307678.pdf %L hal-03493510 %U https://hal.science/hal-03493510 %~ CNRS %~ IMS-BORDEAUX %~ IMS-BORDEAUX-FUSION %~ TEST-HALCNRS %~ ELSEVIER