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https://cnrs.hal.science/hal-03523357
Submitted on : Wednesday, January 12, 2022-4:09:42 PM
Last modification on : Friday, March 24, 2023-2:53:25 PM
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- HAL Id : hal-03523357 , version 1
- DOI : 10.1109/HLM49214.2020.9307843
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Marion Kubler-Riedinger, Dunpin Hong, Jean-Marc Bauchire, Gauthier Deplaude, Patrice Joyeux. Electrical and Morphological Investigations of Electrical Contacts used in Low-Voltage Circuit-Breakers. 2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM), Sep 2020, San Antonio, United States. pp.115-122, ⟨10.1109/HLM49214.2020.9307843⟩. ⟨hal-03523357⟩
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