Comprehensive Kubo-Greenwood modelling of FDSOI MOS devices down to deep cryogenic temperatures - Archive ouverte HAL Access content directly
Journal Articles Solid-State Electronics Year : 2022
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hal-03852801 , version 1 (15-11-2022)

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  • HAL Id : hal-03852801 , version 1

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F. Serra Di Santa Maria, Francis Balestra. Comprehensive Kubo-Greenwood modelling of FDSOI MOS devices down to deep cryogenic temperatures. Solid-State Electronics, 2022. ⟨hal-03852801⟩
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