Journal Articles
Surface and Interface Analysis
Year : 2002
Roland BENOIT : Connect in order to contact the contributor
https://cnrs.hal.science/hal-03878186
Submitted on : Tuesday, November 29, 2022-4:41:37 PM
Last modification on : Friday, March 24, 2023-2:53:29 PM
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N. Mottu, M. Vayer, R. Benoit, R. Erre. Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers?. Surface and Interface Analysis, 2002, 34 (1), pp.276-279. ⟨10.1002/sia.1299⟩. ⟨hal-03878186⟩
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