%0 Journal Article %T Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers? %+ Centre de Recherche sur la Matière Divisée (CRMD) %A Mottu, N. %A Vayer, M. %A Benoit, R. %A Erre, R. %< avec comité de lecture %@ 0142-2421 %J Surface and Interface Analysis %I Wiley-Blackwell %V 34 %N 1 %P 276-279 %8 2002-08 %D 2002 %R 10.1002/sia.1299 %Z Chemical SciencesJournal articles %G English %L hal-03878186 %U https://cnrs.hal.science/hal-03878186 %~ CNRS %~ UNIV-ORLEANS %~ ICMN