Compact Model of a Dual Gate CNTFET: Description and Circuit Application
Johnny Goguet
,
Sebastien Fregonese
,
Cristell Maneux
,
Thomas Zimmer
8th IEEE Conference on Nanotechnology , Aug 2008, Arlington, TEXAS, USA, United States. pp.Page(s):388 - 389,
⟨10.1109/TED.2007.902719⟩
Conference papers
hal-00319955v1
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Optically-Gated CNTFET compact model including source and drain Schottky barrier
Si-Yu Liao
,
Montassar Najari
,
Cristell Maneux
,
Sebastien Fregonese
,
Thomas Zimmer
et al.
5th Conference on Design and Technology of Integrated Systems in Nanoscale Era , Mar 2010, Hammamet, Tunisia. pp.1
Conference papers
hal-00584845v1
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A Scalable Model for Temperature Dependent Thermal Resistance of SiGe HBTs
Kumar Sahoo Amit
,
Sebastien Fregonese
,
Mario Weib
,
Cristell Maneux
,
Thomas Zimmer
et al.
IEEE Bipolar / BiCMOS Circuits and Technology Meeting , Sep 2013, Bordeaux, France
Conference papers
hal-00905673v1
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A Hicum SOI extension
Sébastien Fregonese
,
Gregory Avenier
,
Cristell Maneux
,
A. Chantre
,
Thomas Zimmer
et al.
5th European HICUM Workshop , 2005, France
Conference papers
hal-00181989v1
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Modélisation compacte du transistor à nanotube de carbone
Cristell Maneux
,
Johnny Goguet
,
Thomas Zimmer
Journées thématiques du Club EEA, Nanoélectronique , Mar 2006, France
Conference papers
hal-00181996v1
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Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors
Nathalie Labat
,
Nathalie Malbert
,
Cristell Maneux
,
Andre Touboul
Microelectronics Reliability , 2004, 44, pp.1
Journal articles
hal-00183088v1
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Experimental analysis and 2D simulation of AlGaAs/GaAs HBT base leakage current
Cristell Maneux
,
Nathalie Labat
,
Nathalie Saysset
,
Andre Touboul
,
Yves Danto
et al.
Microelectronics Reliability , 1997, 37, pp.1
Journal articles
hal-00183096v1
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Analysis of avalanche regime in InP HBT's using physical simulation - Implementation in a DC Model
Cristell Maneux
,
Jean-Christophe Martin
,
Nathalie Labat
,
Andre Touboul
,
Muriel Riet
et al.
International Conference on Industrial Technology , 2004, Tunisia. pp.1
Conference papers
hal-00183100v1
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Qualitative Assessment of Epitaxial Graphene FETs on SiC Substrates via Pulsed Measurements and Temperature Variation
Mukherjee Chhandak
,
Sebastien Fregonese
,
Thomas Zimmer
,
H. Happy
,
David Mele
et al.
Conference papers
hal-01090864v1
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TCAD modeling of NPN-SI-BJT electrical performance improvement through SiGe extrinsic stress layer
Al-Sadi Mahmoud
,
Sébastien Fregonese
,
Cristell Maneux
,
Thomas Zimmer
Journal articles
istex
hal-00671678v1
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Avalanche Compact model featuring SiGe HBTs Characteristics up to BVCBO
Mathieu Jaoul
,
Didier Céli
,
Cristell Maneux
HICUM Workshop 2017 , 2017, Dresden, Germany
Conference papers
hal-02511645v1
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0.4-µm InP/InGaAs DHBT with a 380-GHz fT > 600-GHz fMAX and BVCE0 > 4.5 V
Nil Davy
,
Virginie Nodjiadjim
,
Muriel Riet
,
Colin Mismer
,
Marina Deng
et al.
Conference papers
hal-03407761v1
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Why neuromorphic computing need novel 3D technologies? A view from FVLLMONTI European project consortium (Invited)
Cristell Maneux
,
Mukherjee Chhandak
,
Marina Deng
,
Maeva Dubourg
,
Lucas Réveil
et al.
High Performance Embedded Architecture and Compilation, Computing Systems Week, (HiPEAC CSW) Autumn 2021 , Oct 2021, Lyon, France
Conference papers
hal-03408071v1
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Circuit Design Flow dedicated to 3D vertical nanowire FET
Cristell Maneux
,
Mukherjee Chhandak
,
Marina Deng
,
Bruno Neckel Wesling
,
Lucas Réveil
et al.
Conference papers
hal-03765071v1
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CNTFET modeling and reconfigurable logic circuit design
Ian O'Connor
,
Junchen Liu
,
Frédéric Gaffiot
,
Fabien Prégaldiny
,
Cristell Maneux
et al.
Journal articles
hal-00187137v1
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Breakdown mechanisms in advanced SiGe HBTs: scaling and TCAD calibration
Tommy Rosenbaum
,
Didier Céli
,
Michael Schröter
,
Cristell Maneux
Bipolar ArbeitsKreis , Nov 2015, Unterpremstätten, Austria
Conference papers
hal-02511642v1
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A self-aligned vertical HBT for thin SOI SiGeC BiCMOS
Gregory Avenier
,
Thierry Schwartzmann
,
Pascal Chevalier
,
Benoit Vandelle
,
Laurent Rubaldo
et al.
BCTM 2005, Bipolar/BiCMOS circuits and technology meeting , 2005, États-Unis. pp.1
Conference papers
hal-00181977v1
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Limitations des performances du TBH InP/GaAsSb/InP à forts niveaux d'injection
Mohamed Belhaj
,
Cristell Maneux
,
Nathalie Labat
,
Andre Touboul
Journées du GDR Nanoélectronique , 2003, France. pp.1
Conference papers
hal-00183471v1
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TBH GaInP/GaAs planar : Analyse de deux mécanismes de défaillances
Cristell Maneux
,
Nathalie Labat
,
Andre Touboul
,
Yves Danto
,
Muriel Riet
et al.
Journées Nationales Microélectroniques et optoélectroniques , 1999, France. pp.1
Conference papers
hal-00183479v1
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Comparaison de HEMTs AlGaAs/GaAs et AlGaAs/InGaAs par l'analyse du bruit basses fréquences
Nathalie Saysset
,
Nathalie Labat
,
Cristell Maneux
,
Andre Touboul
,
Yves Danto
et al.
Journées Microélectronique et Optoélectronique III-V , 1994, France. pp.1
Conference papers
hal-00183488v1
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Effects of RF life-test on LF electrical parameters of GaAs power MESFETs
Nathalie Malbert
,
Benoit Lambert
,
Cristell Maneux
,
Nathalie Labat
,
Andre Touboul
et al.
Microelectronics Reliability , 1999, 39, pp.1
Journal articles
hal-00183094v1
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Obtaining Isothermal Data for HBT
Sébastien Fregonese
,
Thomas Zimmer
,
Hassene Mnif
,
P. Baureis
,
Cristell Maneux
et al.
IEEE Transactions on Electron Devices , 2004, 51, pp.1211-1214
Journal articles
hal-00181975v1
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Barrier effects in SiGe HBT: Modeling of high-injection base current increase
Sébastien Fregonese
,
Thomas Zimmer
,
Cristell Maneux
,
Pierre-Yvan Sulima
IEEE Bipolar/BiCMOS circuits and technology meeting , 2004, Canada. pp.1
Conference papers
hal-00181982v1
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Extrinsic leakage current on InP/InGaAs DHBTs
Jean-Christophe Martin
,
Cristell Maneux
,
Nathalie Labat
,
Andre Touboul
,
Muriel Riet
et al.
2003 IEEE Conference on Indium Phosphide and Related Materials , 2003, United States. pp.1
Conference papers
hal-00183469v1
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Modèle compact du transistor double grille CNTFET
Johnny Goguet
,
Sebastien Fregonese
,
Cristell Maneux
,
Thomas Zimmer
Journées thématiques sur la simulation multiphysique de composants et dispositifs nanométriques , Dec 2007, Lille, France
Conference papers
hal-00197536v1
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Computationally Efficient Physics-Based Compact CNTFET Model for Circuit Design
Sebastien Fregonese
,
Hughes Cazin d'Honincthun
,
Johnny Goguet
,
Cristell Maneux
,
Thomas Zimmer
et al.
IEEE Transactions on Electron Devices , 2008, 55 (6), pp.1317-1326
Journal articles
hal-00287142v1
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Optimized Ring Oscillator With 1.65-ps Gate Delay in a SiGe:C HBT Technology
Mario Weib
,
Cédric Majek
,
Kumar Sahoo Amit
,
Cristell Maneux
,
Olivier Mazouffre
et al.
Journal articles
hal-00906390v1
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High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects
Mohamed Belhaj
,
Cristell Maneux
,
Nathalie Labat
,
Andre Touboul
,
Philippe Bove
et al.
Microelectronics Reliability , 2003, 43, pp.1
Journal articles
hal-00183091v1
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Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current
Marine Couret
,
Gerhard Fischer
,
Iria Garcia-Lopez
,
Magali de Matos
,
François Marc
et al.
ESSDERC 2019 , Sep 2019, Cracow, Poland
Conference papers
hal-02379120v1
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Link between low frequency noise and reliability of compound semiconductor HEMTs and HBTs
Nathalie Labat
,
Nathalie Malbert
,
Cristell Maneux
,
Arnaud Curutchet
,
Brice Grandchamp
et al.
INCF 2011 , Jun 2011, Toronto, Canada. pp.458-463
Conference papers
hal-00585593v1
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