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authFullName_s : Cristell Maneux

Compact Model of a Dual Gate CNTFET: Description and Circuit Application

Johnny Goguet , Sebastien Fregonese , Cristell Maneux , Thomas Zimmer
8th IEEE Conference on Nanotechnology, Aug 2008, Arlington, TEXAS, USA, United States. pp.Page(s):388 - 389, ⟨10.1109/TED.2007.902719⟩
Conference papers hal-00319955v1

Optically-Gated CNTFET compact model including source and drain Schottky barrier

Si-Yu Liao , Montassar Najari , Cristell Maneux , Sebastien Fregonese , Thomas Zimmer et al.
5th Conference on Design and Technology of Integrated Systems in Nanoscale Era, Mar 2010, Hammamet, Tunisia. pp.1
Conference papers hal-00584845v1

A Scalable Model for Temperature Dependent Thermal Resistance of SiGe HBTs

Kumar Sahoo Amit , Sebastien Fregonese , Mario Weib , Cristell Maneux , Thomas Zimmer et al.
IEEE Bipolar / BiCMOS Circuits and Technology Meeting, Sep 2013, Bordeaux, France
Conference papers hal-00905673v1

A Hicum SOI extension

Sébastien Fregonese , Gregory Avenier , Cristell Maneux , A. Chantre , Thomas Zimmer et al.
5th European HICUM Workshop, 2005, France
Conference papers hal-00181989v1

Modélisation compacte du transistor à nanotube de carbone

Cristell Maneux , Johnny Goguet , Thomas Zimmer
Journées thématiques du Club EEA, Nanoélectronique, Mar 2006, France
Conference papers hal-00181996v1

Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors

Nathalie Labat , Nathalie Malbert , Cristell Maneux , Andre Touboul
Microelectronics Reliability, 2004, 44, pp.1
Journal articles hal-00183088v1

Experimental analysis and 2D simulation of AlGaAs/GaAs HBT base leakage current

Cristell Maneux , Nathalie Labat , Nathalie Saysset , Andre Touboul , Yves Danto et al.
Microelectronics Reliability, 1997, 37, pp.1
Journal articles hal-00183096v1

Analysis of avalanche regime in InP HBT's using physical simulation - Implementation in a DC Model

Cristell Maneux , Jean-Christophe Martin , Nathalie Labat , Andre Touboul , Muriel Riet et al.
International Conference on Industrial Technology, 2004, Tunisia. pp.1
Conference papers hal-00183100v1

Qualitative Assessment of Epitaxial Graphene FETs on SiC Substrates via Pulsed Measurements and Temperature Variation

Mukherjee Chhandak , Sebastien Fregonese , Thomas Zimmer , H. Happy , David Mele et al.
Solid State Device Research Conference (ESSDERC), 2014, 44th European, Sep 2014, Venise, Italy. ⟨10.1109/ESSDERC.2014.6948821⟩
Conference papers hal-01090864v1

TCAD modeling of NPN-SI-BJT electrical performance improvement through SiGe extrinsic stress layer

Al-Sadi Mahmoud , Sébastien Fregonese , Cristell Maneux , Thomas Zimmer
Materials Science in Semiconductor Processing, 2010, 13 (5-6), pp. 344-348. ⟨10.1016/j.mssp.2011.03.002⟩
Journal articles istex hal-00671678v1

Avalanche Compact model featuring SiGe HBTs Characteristics up to BVCBO

Mathieu Jaoul , Didier Céli , Cristell Maneux
HICUM Workshop 2017, 2017, Dresden, Germany
Conference papers hal-02511645v1
Image document

0.4-µm InP/InGaAs DHBT with a 380-GHz fT > 600-GHz fMAX and BVCE0 > 4.5 V

Nil Davy , Virginie Nodjiadjim , Muriel Riet , Colin Mismer , Marina Deng et al.
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS), Dec 2021, Monterey, United States. ⟨10.1109/BCICTS50416.2021.9682209⟩
Conference papers hal-03407761v1

Why neuromorphic computing need novel 3D technologies? A view from FVLLMONTI European project consortium (Invited)

Cristell Maneux , Mukherjee Chhandak , Marina Deng , Maeva Dubourg , Lucas Réveil et al.
High Performance Embedded Architecture and Compilation, Computing Systems Week, (HiPEAC CSW) Autumn 2021, Oct 2021, Lyon, France
Conference papers hal-03408071v1
Image document

Circuit Design Flow dedicated to 3D vertical nanowire FET

Cristell Maneux , Mukherjee Chhandak , Marina Deng , Bruno Neckel Wesling , Lucas Réveil et al.
IEEE Latin American Electron Devices Conference (LAEDC 2022), Jul 2022, Puebla, Mexico. ⟨10.1109/LAEDC54796.2022.9908233⟩
Conference papers hal-03765071v1

CNTFET modeling and reconfigurable logic circuit design

Ian O'Connor , Junchen Liu , Frédéric Gaffiot , Fabien Prégaldiny , Cristell Maneux et al.
IEEE Transactions on Circuits and Systems, 2007, 54 (11), pp.2365-2379. ⟨10.1109/TCSI.2007.907835⟩
Journal articles hal-00187137v1

Breakdown mechanisms in advanced SiGe HBTs: scaling and TCAD calibration

Tommy Rosenbaum , Didier Céli , Michael Schröter , Cristell Maneux
Bipolar ArbeitsKreis, Nov 2015, Unterpremstätten, Austria
Conference papers hal-02511642v1

A self-aligned vertical HBT for thin SOI SiGeC BiCMOS

Gregory Avenier , Thierry Schwartzmann , Pascal Chevalier , Benoit Vandelle , Laurent Rubaldo et al.
BCTM 2005, Bipolar/BiCMOS circuits and technology meeting, 2005, États-Unis. pp.1
Conference papers hal-00181977v1

Limitations des performances du TBH InP/GaAsSb/InP à forts niveaux d'injection

Mohamed Belhaj , Cristell Maneux , Nathalie Labat , Andre Touboul
Journées du GDR Nanoélectronique, 2003, France. pp.1
Conference papers hal-00183471v1

TBH GaInP/GaAs planar : Analyse de deux mécanismes de défaillances

Cristell Maneux , Nathalie Labat , Andre Touboul , Yves Danto , Muriel Riet et al.
Journées Nationales Microélectroniques et optoélectroniques, 1999, France. pp.1
Conference papers hal-00183479v1

Comparaison de HEMTs AlGaAs/GaAs et AlGaAs/InGaAs par l'analyse du bruit basses fréquences

Nathalie Saysset , Nathalie Labat , Cristell Maneux , Andre Touboul , Yves Danto et al.
Journées Microélectronique et Optoélectronique III-V, 1994, France. pp.1
Conference papers hal-00183488v1

Effects of RF life-test on LF electrical parameters of GaAs power MESFETs

Nathalie Malbert , Benoit Lambert , Cristell Maneux , Nathalie Labat , Andre Touboul et al.
Microelectronics Reliability, 1999, 39, pp.1
Journal articles hal-00183094v1

Obtaining Isothermal Data for HBT

Sébastien Fregonese , Thomas Zimmer , Hassene Mnif , P. Baureis , Cristell Maneux et al.
IEEE Transactions on Electron Devices, 2004, 51, pp.1211-1214
Journal articles hal-00181975v1

Barrier effects in SiGe HBT: Modeling of high-injection base current increase

Sébastien Fregonese , Thomas Zimmer , Cristell Maneux , Pierre-Yvan Sulima
IEEE Bipolar/BiCMOS circuits and technology meeting, 2004, Canada. pp.1
Conference papers hal-00181982v1

Extrinsic leakage current on InP/InGaAs DHBTs

Jean-Christophe Martin , Cristell Maneux , Nathalie Labat , Andre Touboul , Muriel Riet et al.
2003 IEEE Conference on Indium Phosphide and Related Materials, 2003, United States. pp.1
Conference papers hal-00183469v1

Modèle compact du transistor double grille CNTFET

Johnny Goguet , Sebastien Fregonese , Cristell Maneux , Thomas Zimmer
Journées thématiques sur la simulation multiphysique de composants et dispositifs nanométriques, Dec 2007, Lille, France
Conference papers hal-00197536v1

Computationally Efficient Physics-Based Compact CNTFET Model for Circuit Design

Sebastien Fregonese , Hughes Cazin d'Honincthun , Johnny Goguet , Cristell Maneux , Thomas Zimmer et al.
IEEE Transactions on Electron Devices, 2008, 55 (6), pp.1317-1326
Journal articles hal-00287142v1

Optimized Ring Oscillator With 1.65-ps Gate Delay in a SiGe:C HBT Technology

Mario Weib , Cédric Majek , Kumar Sahoo Amit , Cristell Maneux , Olivier Mazouffre et al.
IEEE Electron Device Letters, 2013, 34 (10), pp.1214 - 1216. ⟨10.1109/LED.2013.2277550⟩
Journal articles hal-00906390v1

High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects

Mohamed Belhaj , Cristell Maneux , Nathalie Labat , Andre Touboul , Philippe Bove et al.
Microelectronics Reliability, 2003, 43, pp.1
Journal articles hal-00183091v1

Impact of SiGe HBT hot-carrier degradation on the broadband amplifier output supply current

Marine Couret , Gerhard Fischer , Iria Garcia-Lopez , Magali de Matos , François Marc et al.
ESSDERC 2019, Sep 2019, Cracow, Poland
Conference papers hal-02379120v1

Link between low frequency noise and reliability of compound semiconductor HEMTs and HBTs

Nathalie Labat , Nathalie Malbert , Cristell Maneux , Arnaud Curutchet , Brice Grandchamp et al.
INCF 2011, Jun 2011, Toronto, Canada. pp.458-463
Conference papers hal-00585593v1