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authFullName_s : D. Dorairaj

XPS, ToF SIMS and wettability analyses on Ni surfaces after Ar-H2 RF plasma treatment: An efficient and optimized plasma treatment approach

L. Vivet , R. Benoit , M.F. Falzon , K.-L. Tan , D. Dorairaj et al.
Surface and Coatings Technology, 2020, 398, pp.126094. ⟨10.1016/j.surfcoat.2020.126094⟩
Journal articles hal-03880604v1