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authFullName_s : J.-M. Vinassa
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Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application

M. Maures , A. Capitaine , J.-Y. Delétage , J.-M. Vinassa , O. Briat et al.
Microelectronics Reliability, 2020, 114, pp.113798 -. ⟨10.1016/j.microrel.2020.113798⟩
Journal articles hal-03493060v1

Initiation à la recherche sur la fiabilité en microélectronique par la physique : mini-projets en laboratoire

O. Briat , J.-Y. Delétage , T. Dubois , G. Duchamp , H. Frémont et al.
13ème Colloque sur l'Enseignement des Technologies et des Sciences de l'Information et des Systèmes (CETSIS), Oct 2018, Fes, Maroc
Conference papers hal-02518400v1
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Investigation of critical parameters in power supplies components failure due to electric pulse

L. Curos , T. Dubois , G. Mejecaze , F. Puybaret , B. Plano et al.
Microelectronics Reliability, 2020, 114, pp.113936 -. ⟨10.1016/j.microrel.2020.113936⟩
Journal articles hal-03493510v1
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Destruction analyses of power supplies due to electric pulse

G. Mejecaze , T. Dubois , L. Curos , F. Puybaret , J.-M. Vinassa et al.
Microelectronics Reliability, 2019, 100-101, pp.113470 -. ⟨10.1016/j.microrel.2019.113470⟩
Journal articles hal-03488481v1

Lithium Battery Aging Model Based on Chemical Rate Approach

I. Baghdadi , O. Briat , P. Gyan , J.-M. Vinassa
Proceedings of IEEE Vehicle Power and Propulsion Conference (VPPC), Oct 2016, Hangzhou, China
Conference papers hal-02518372v1