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authFullName_s : L. Curos
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Investigation of critical parameters in power supplies components failure due to electric pulse

L. Curos , T. Dubois , G. Mejecaze , F. Puybaret , B. Plano et al.
Microelectronics Reliability, 2020, 114, pp.113936 -. ⟨10.1016/j.microrel.2020.113936⟩
Journal articles hal-03493510v1
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Destruction analyses of power supplies due to electric pulse

G. Mejecaze , T. Dubois , L. Curos , F. Puybaret , J.-M. Vinassa et al.
Microelectronics Reliability, 2019, 100-101, pp.113470 -. ⟨10.1016/j.microrel.2019.113470⟩
Journal articles hal-03488481v1

Analyse de destructions d’alimentations soumises à des impulsions forts niveaux

L. Curos , T. Dubois , G. Mejecaze , F. Puybaret , J. M. Vinassa et al.
Proceedings of Journée thématique GDR Ondes - Sécurité des systèmes électroniques et communicants, Paris, 2019, 2019, Paris, France
Conference papers hal-02516494v1