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authFullName_s : M. Vayer

Is XPS combined with argon ion sputtering pertinent for depth profiling molybdenum-implanted stainless-steel layers?

N. Mottu , M. Vayer , R. Benoit , R. Erre
Surface and Interface Analysis, 2002, 34 (1), pp.276-279. ⟨10.1002/sia.1299⟩
Journal articles istex hal-03878186v1

Molybdenum implantation of stainless steel in the near surface layer: structural and chemical exploration

N. Mottu , M. Vayer , P. Andreazza , R. Benoit , Th. Sauvage et al.
2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000, Sep 2000, Alpbach, Austria. pp.761-764, ⟨10.1109/.2000.924265⟩
Conference papers hal-03878168v1