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authFullName_s : S Beauvarlet

Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron–ion imaging

A Comby , E Bloch , S Beauvarlet , D Rajak , S Beaulieu et al.
Journal of Physics B: Atomic, Molecular and Optical Physics, 2020, 53 (23), pp.234003. ⟨10.1088/1361-6455/abbe27⟩
Journal articles hal-03005114v1