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authFullName_s : V. Destefanis

Controlled Dislocations Injection in N/P Hg1−xCdxTe Photodiodes by Indentations

T. Broult , A. Kerlain , V. Destefanis , P. Guinedor , E. Le Bourhis et al.
Journal of Electronic Materials, 2019, 48 (10), pp.6108-6112. ⟨10.1007/s11664-019-07139-0⟩
Journal articles hal-02351844v1

DLTS study of extended defects in HgCdTe photodiodes

P. Guinedor , T. Broult , A. Brunner , L. Rubaldo , D. Bauza et al.
19th International Conference on Extended Defects in Semiconductors (EDS), eds2016.sciencesconf.org, Jun 2018, Thessaloniki, Greece
Conference papers hal-02016057v1

Strain in epitaxial Si/SiGe graded buffer structures grown on Si(100), SI(110) and SI(111) optically evaluated by polarized Raman spectroscopy and imaging.

Michel Mermoux , Alexandre Crisci , Francis Baillet , V. Destefanis , V. Rouchon et al.
Journal of Applied Physics, 2010, 107, pp.013512 1-10
Journal articles hal-00456991v1

Composition and Face Polarity Influences on Mechanical Properties of (111) Cd1−yZnyTe Determined by Indentation

T. Broult , E. Le Bourhis , G. Patriarche , A. Kerlain , V. Destefanis et al.
Journal of Electronic Materials, 2019, 48 (11), pp.6985-6990. ⟨10.1007/s11664-019-07495-x⟩
Journal articles hal-02351821v1

DLTS study of extended defects in HgCdTe photodiodes

P. Guinedor , T. Broult , A Brunner , L. Rubaldo , D. Bauza et al.
Journal of Physics: Conference Series, 2019, 1190, pp.012012. ⟨10.1088/1742-6596/1190/1/012012⟩
Journal articles hal-02372403v1

Improvement of RTS Noise in HgCdTe MWIR Detectors

Alexandre Brunner , Laurent Rubaldo , V. Destefanis , F. Chabuel , A. Kerlain et al.
Journal of Electronic Materials, 2014, 43 (8), pp.3060-3064. ⟨10.1007/s11664-014-3217-z⟩
Journal articles hal-02013558v1