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Controlled Dislocations Injection in N/P Hg1−xCdxTe Photodiodes by Indentations
T. Broult
,
A. Kerlain
,
V. Destefanis
,
P. Guinedor
,
E. Le Bourhis
et al.
Journal articles
hal-02351844v1
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DLTS study of extended defects in HgCdTe photodiodes
P. Guinedor
,
T. Broult
,
A. Brunner
,
L. Rubaldo
,
D. Bauza
et al.
19th International Conference on Extended Defects in Semiconductors (EDS), eds2016.sciencesconf.org, Jun 2018, Thessaloniki, Greece
Conference papers
hal-02016057v1
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Strain in epitaxial Si/SiGe graded buffer structures grown on Si(100), SI(110) and SI(111) optically evaluated by polarized Raman spectroscopy and imaging.
Michel Mermoux
,
Alexandre Crisci
,
Francis Baillet
,
V. Destefanis
,
V. Rouchon
et al.
Journal of Applied Physics, 2010, 107, pp.013512 1-10
Journal articles
hal-00456991v1
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Composition and Face Polarity Influences on Mechanical Properties of (111) Cd1−yZnyTe Determined by Indentation
T. Broult
,
E. Le Bourhis
,
G. Patriarche
,
A. Kerlain
,
V. Destefanis
et al.
Journal articles
hal-02351821v1
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DLTS study of extended defects in HgCdTe photodiodes
P. Guinedor
,
T. Broult
,
A Brunner
,
L. Rubaldo
,
D. Bauza
et al.
Journal articles
hal-02372403v1
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Improvement of RTS Noise in HgCdTe MWIR Detectors
Alexandre Brunner
,
Laurent Rubaldo
,
V. Destefanis
,
F. Chabuel
,
A. Kerlain
et al.
Journal articles
hal-02013558v1
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