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authIdHal_s : alberto-bosio
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A Survey of Testing Techniques for Approximate Integrated Circuits

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio et al.
Proceedings of the IEEE, 2020, 108 (12), pp.2178 - 2194. ⟨10.1109/JPROC.2020.2999613⟩
Journal articles lirmm-02395609v1
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Design and performance parameters of an ultra-low voltage, single supply 32bit processor implemented in 28nm FDSOI technology

Sylvain Clerc , Fady Abouzeid , Darayus Adil Patel , Jean-Marc Daveau , Cyril Bottoni et al.
ISQED 2015 - 16th International Symposium on Quality Electronic Design, Apr 2015, Santa Clara, United States. pp.366-370, ⟨10.1109/ISQED.2015.7085453⟩
Conference papers lirmm-01272913v1
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Test Solution for Data Retention Faults in Low-Power SRAMs

Leonardo B. Zordan , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
DATE 2013 - 16th Design, Automation and Test in Europe Conference, Mar 2013, Grenoble, France. pp.442-447, ⟨10.7873/DATE.2013.099⟩
Conference papers lirmm-00805140v1

Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
Journal of Electronic Testing: : Theory and Applications, 2012, 28 (2), pp.215-228. ⟨10.1007/s10836-012-5277-4⟩
Journal articles istex lirmm-00806773v1

A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits

Ahn Duc Tran , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
GDR SOC-SIP'11 : Colloque GDR SoC-SiP, Lyon, France
Conference papers lirmm-00679513v1
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Survey on Approximate Computing and Its Intrinsic Fault Tolerance

Gennaro Rodrigues , Fernanda Lima Kastensmidt , Alberto Bosio
Electronics, 2020, 9 (4), pp.557. ⟨10.3390/electronics9040557⟩
Journal articles hal-03896785v1

Digital Testing

Alberto Bosio
Silicon Systems for Wireless LAN, World Scientific, pp.341-359, 2020, ⟨10.1142/9789811210723_0013⟩
Book sections hal-03111313v1

Approximate Computing for Safety-Critical Applications

Gennaro Rodrigues , Fernanda Kastensmidt , Alberto Bosio
2021 IEEE 22nd Latin American Test Symposium (LATS), Oct 2021, Punta del Este, France. pp.1-3, ⟨10.1109/LATS53581.2021.9651813⟩
Conference papers hal-03774976v1
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Maximizing Yield for Approximate Integrated Circuits

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio et al.
DATE 2020 - 23rd Design, Automation and Test in Europe Conference and Exhibition, Mar 2020, Grenoble, France. pp.810-815, ⟨10.23919/DATE48585.2020.9116341⟩
Conference papers lirmm-03036002v1

Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection

Gennaro Severino Rodrigues , Fernanda Lima Kastensmidt , Vincent Pouget , Alberto Bosio
LATS: Latin-American Test Symposium, Mar 2018, Sao Paulo, Brazil. ⟨10.1109/LATW.2018.8349675⟩
Conference papers hal-02095644v1
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Emerging Technologies: Challenges and Opportunities for Logic Synthesis

Alberto Bosio , Mayeul Cantan , Cédric Marchand , Ian O'Connor , Petr Fiser et al.
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Apr 2021, Vienna (virtual), Austria. pp.93-98, ⟨10.1109/DDECS52668.2021.9417062⟩
Conference papers hal-03266914v1
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A Survey on Deep Learning Resilience Assessment Methodologies

Annachiara Ruospo , Ernesto Sanchez , Lucas Matana Luza , Luigi Dilillo , Marcello Traiola et al.
Computer, In press, ⟨10.1109/MC.2022.3217841⟩
Journal articles lirmm-03834128v1
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AdequateDL: Approximating Deep Learning Accelerators

Olivier Sentieys , Silviu-Ioan Filip , David Briand , David Novo , Etienne Dupuis et al.
DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Apr 2021, Vienna (virtual), Austria. pp.37-40, ⟨10.1109/DDECS52668.2021.9417026⟩
Conference papers hal-03266861v1
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Approximations in Deep Learning

Etienne Dupuis , Silviu-Ioan Filip , Olivier Sentieys , David Novo , Ian O'Connor et al.
Approximate Computing Techniques - From Component- to Application-Level, pp.467-512, 2022, 978-3-030-94704-0. ⟨10.1007/978-3-030-94705-7_15⟩
Book sections hal-03494874v1

An Approximate Error-Detection Technique for Multi-Core Real-Time Systems

Gennaro Rodrigues , Adria Barros , Israel Lopes , Vincent Pouget , Alberto Bosio et al.
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS), Sep 2019, Montpellier, France. pp.01-04, ⟨10.1109/RADECS47380.2019.9745688⟩
Conference papers hal-03890419v1

Cell-Aware Diagnosis of Automotive Customer Returns Based on Supervised Learning

Safa Mhamdi , Patrick Girard , Arnaud Virazel , Alberto Bosio , Aymen Ladhar et al.
ART 2019 - 4th IEEE Automotive Reliability and Test Workshop, Nov 2019, Washington, United States
Conference papers lirmm-02395653v1

A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure

Marcello Traiola , Arnaud Virazel , Patrick Girard , Mario Barbareschi , Alberto Bosio et al.
IEEE Transactions on Nanotechnology, 2019, 18, pp.849-857. ⟨10.1109/TNANO.2019.2923040⟩
Journal articles lirmm-02395306v1

A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash Technology

Pierre-Didier Mauroux , Arnaud Virazel , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece
Conference papers lirmm-00647750v1

Variability Analysis of an SRAM Test Chip

Renan Alves Fonseca , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
ETS: European Test Symposium, May 2011, Trondheim, Norway
Conference papers lirmm-00651791v1

Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing

Fangmei Wu , Luigi Dilillo , Alberto Bosio , Patrick Girard , Serge Pravossoudovitch et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era, 2011, Athènes, Greece. ⟨10.1109/DTIS.2011.5941434⟩
Conference papers lirmm-00647760v1

Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems

Maha Kooli , Giorgio Di Natale , Alberto Bosio
Journal of Electronic Testing: : Theory and Applications, 2019, ⟨10.1007/s10836-019-05785-0⟩
Journal articles hal-02078889v1

Thermal issues in test: An overview of the significant aspects and industrial practice

Juergen Alt , Paolo Bernardi , Alberto Bosio , Ricardo Cantoro , Hans Kerkhoff et al.
VTS: VLSI Test Symposium, Apr 2016, Las Vegas, NV, United States. ⟨10.1109/VTS.2016.7477278⟩
Conference papers lirmm-01447125v1
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An intra-cell defect grading tool

Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial , Stefano Bernabovi et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.298-301, ⟨10.1109/DDECS.2014.6868814⟩
Conference papers lirmm-01248591v1

A novel Adaptive Fault Tolerant Flip-Flop Architecture based on TMR

Luca Cassano , Alberto Bosio , Giorgio Di Natale
ETS: European Test Symposium, May 2014, Paderborn, Germany. ⟨10.1109/ETS.2014.6847831⟩
Conference papers lirmm-01234133v1

On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell

Elena Ioana Vatajelu , Georgios Tsiligiannis , Luigi Dilillo , Alberto Bosio , Patrick Girard et al.
DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Oct 2013, New York, United States. pp.143-148, ⟨10.1109/DFT.2013.6653597⟩
Conference papers lirmm-01238413v1

Timing-aware ATPG for critical paths with multiple TSVs

Carolina Momo Metzler , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
DDECS: Design and Diagnostics of Electronic Circuits and Systems, Apr 2014, Warsaw, Poland. pp.116-121, ⟨10.1109/DDECS.2014.6868774⟩
Conference papers lirmm-01248600v1

A novel method to mitigate TSV electromigration for 3D ICs

Yuanqing Cheng , Aida Todri-Sanial , Alberto Bosio , Luigi Dilillo , Patrick Girard et al.
ISVLSI: IEEE Computer Society Annual Symposium on VLSI, Aug 2013, Natal, Brazil. pp.121-126, ⟨10.1109/ISVLSI.2013.6654633⟩
Conference papers lirmm-01248617v1

Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire)

Patrick Girard , Serge Bernard , Florence Azaïs , Alberto Bosio , Luigi Dilillo et al.
2010
Other publications lirmm-00504873v1

Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
Colloque GDR SoC-SiP, 2012, Paris, France
Conference papers lirmm-00806841v1

Fault Localization Improvement through an Intra-Cell Diagnosis Approach

Zhenzhou Sun , Alberto Bosio , Luigi Dilillo , Patrick Girard , Aida Todri-Sanial et al.
ISTFA 2012 - 38th International Symposium for Testing and Failure Analysis, Nov 2012, Phoenix, AZ, United States. pp.509-519
Conference papers lirmm-00806863v1