A Survey of Testing Techniques for Approximate Integrated Circuits
Marcello Traiola
,
Arnaud Virazel
,
Patrick Girard
,
Mario Barbareschi
,
Alberto Bosio
et al.
Journal articles
lirmm-02395609v1
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Design and performance parameters of an ultra-low voltage, single supply 32bit processor implemented in 28nm FDSOI technology
Sylvain Clerc
,
Fady Abouzeid
,
Darayus Adil Patel
,
Jean-Marc Daveau
,
Cyril Bottoni
et al.
ISQED 2015 - 16th International Symposium on Quality Electronic Design , Apr 2015, Santa Clara, United States. pp.366-370,
⟨10.1109/ISQED.2015.7085453⟩
Conference papers
lirmm-01272913v1
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Test Solution for Data Retention Faults in Low-Power SRAMs
Leonardo B. Zordan
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
DATE 2013 - 16th Design, Automation and Test in Europe Conference , Mar 2013, Grenoble, France. pp.442-447,
⟨10.7873/DATE.2013.099⟩
Conference papers
lirmm-00805140v1
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Analysis and Fault Modeling of Actual Resistive Defects in ATMELtm eFlash Memories
Pierre-Didier Mauroux
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Journal articles
istex
lirmm-00806773v1
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A Hybrid Fault Tolerant Architecture for Robustness Improvement of Digital Circuits
Ahn Duc Tran
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
GDR SOC-SIP'11 : Colloque GDR SoC-SiP , Lyon, France
Conference papers
lirmm-00679513v1
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Survey on Approximate Computing and Its Intrinsic Fault Tolerance
Gennaro Rodrigues
,
Fernanda Lima Kastensmidt
,
Alberto Bosio
Journal articles
hal-03896785v1
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Digital Testing
Alberto Bosio
Book sections
hal-03111313v1
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Approximate Computing for Safety-Critical Applications
Gennaro Rodrigues
,
Fernanda Kastensmidt
,
Alberto Bosio
Conference papers
hal-03774976v1
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Maximizing Yield for Approximate Integrated Circuits
Marcello Traiola
,
Arnaud Virazel
,
Patrick Girard
,
Mario Barbareschi
,
Alberto Bosio
et al.
Conference papers
lirmm-03036002v1
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Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection
Gennaro Severino Rodrigues
,
Fernanda Lima Kastensmidt
,
Vincent Pouget
,
Alberto Bosio
Conference papers
hal-02095644v1
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Emerging Technologies: Challenges and Opportunities for Logic Synthesis
Alberto Bosio
,
Mayeul Cantan
,
Cédric Marchand
,
Ian O'Connor
,
Petr Fiser
et al.
2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) , Apr 2021, Vienna (virtual), Austria. pp.93-98,
⟨10.1109/DDECS52668.2021.9417062⟩
Conference papers
hal-03266914v1
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A Survey on Deep Learning Resilience Assessment Methodologies
Annachiara Ruospo
,
Ernesto Sanchez
,
Lucas Matana Luza
,
Luigi Dilillo
,
Marcello Traiola
et al.
Journal articles
lirmm-03834128v1
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AdequateDL: Approximating Deep Learning Accelerators
Olivier Sentieys
,
Silviu-Ioan Filip
,
David Briand
,
David Novo
,
Etienne Dupuis
et al.
DDECS 2021 - 24th International Symposium on Design and Diagnostics of Electronic Circuits and Systems , Apr 2021, Vienna (virtual), Austria. pp.37-40,
⟨10.1109/DDECS52668.2021.9417026⟩
Conference papers
hal-03266861v1
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Approximations in Deep Learning
Etienne Dupuis
,
Silviu-Ioan Filip
,
Olivier Sentieys
,
David Novo
,
Ian O'Connor
et al.
Book sections
hal-03494874v1
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An Approximate Error-Detection Technique for Multi-Core Real-Time Systems
Gennaro Rodrigues
,
Adria Barros
,
Israel Lopes
,
Vincent Pouget
,
Alberto Bosio
et al.
2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS) , Sep 2019, Montpellier, France. pp.01-04,
⟨10.1109/RADECS47380.2019.9745688⟩
Conference papers
hal-03890419v1
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Cell-Aware Diagnosis of Automotive Customer Returns Based on Supervised Learning
Safa Mhamdi
,
Patrick Girard
,
Arnaud Virazel
,
Alberto Bosio
,
Aymen Ladhar
et al.
ART 2019 - 4th IEEE Automotive Reliability and Test Workshop , Nov 2019, Washington, United States
Conference papers
lirmm-02395653v1
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A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure
Marcello Traiola
,
Arnaud Virazel
,
Patrick Girard
,
Mario Barbareschi
,
Alberto Bosio
et al.
Journal articles
lirmm-02395306v1
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A DfT Solution for Oxide Thickness Varitions in ATMEL eFlash Technology
Pierre-Didier Mauroux
,
Arnaud Virazel
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
DTIS: Design and Technology of Integrated Systems in Nanoscale Era , 2011, Athènes, Greece
Conference papers
lirmm-00647750v1
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Variability Analysis of an SRAM Test Chip
Renan Alves Fonseca
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
ETS: European Test Symposium , May 2011, Trondheim, Norway
Conference papers
lirmm-00651791v1
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Power Reduction Through X-filling of Transition Fault Test Vectors for LOS Testing
Fangmei Wu
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
,
Serge Pravossoudovitch
et al.
Conference papers
lirmm-00647760v1
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Memory-Aware Design Space Exploration for Reliability Evaluation in Computing Systems
Maha Kooli
,
Giorgio Di Natale
,
Alberto Bosio
Journal articles
hal-02078889v1
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Thermal issues in test: An overview of the significant aspects and industrial practice
Juergen Alt
,
Paolo Bernardi
,
Alberto Bosio
,
Ricardo Cantoro
,
Hans Kerkhoff
et al.
Conference papers
lirmm-01447125v1
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An intra-cell defect grading tool
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
,
Stefano Bernabovi
et al.
Conference papers
lirmm-01248591v1
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A novel Adaptive Fault Tolerant Flip-Flop Architecture based on TMR
Luca Cassano
,
Alberto Bosio
,
Giorgio Di Natale
Conference papers
lirmm-01234133v1
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On the correlation between Static Noise Margin and Soft Error Rate evaluated for a 40nm SRAM cell
Elena Ioana Vatajelu
,
Georgios Tsiligiannis
,
Luigi Dilillo
,
Alberto Bosio
,
Patrick Girard
et al.
DFT: Defect and Fault Tolerance in VLSI and Nanotechnology Systems , Oct 2013, New York, United States. pp.143-148,
⟨10.1109/DFT.2013.6653597⟩
Conference papers
lirmm-01238413v1
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Timing-aware ATPG for critical paths with multiple TSVs
Carolina Momo Metzler
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Conference papers
lirmm-01248600v1
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A novel method to mitigate TSV electromigration for 3D ICs
Yuanqing Cheng
,
Aida Todri-Sanial
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
et al.
Conference papers
lirmm-01248617v1
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Contrat TOETS CT 302 - Programme CEE CATRENE (Rapport Intermédiaire)
Patrick Girard
,
Serge Bernard
,
Florence Azaïs
,
Alberto Bosio
,
Luigi Dilillo
et al.
2010
Other publications
lirmm-00504873v1
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Defect Localization Through an Effect-Cause based Intra-Cell Diagnosis
Zhenzhou Sun
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
Colloque GDR SoC-SiP , 2012, Paris, France
Conference papers
lirmm-00806841v1
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Fault Localization Improvement through an Intra-Cell Diagnosis Approach
Zhenzhou Sun
,
Alberto Bosio
,
Luigi Dilillo
,
Patrick Girard
,
Aida Todri-Sanial
et al.
ISTFA 2012 - 38th International Symposium for Testing and Failure Analysis , Nov 2012, Phoenix, AZ, United States. pp.509-519
Conference papers
lirmm-00806863v1
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