Compact Model of a Dual Gate CNTFET: Description and Circuit Application
Johnny Goguet
,
Sebastien Fregonese
,
Cristell Maneux
,
Thomas Zimmer
8th IEEE Conference on Nanotechnology , Aug 2008, Arlington, TEXAS, USA, United States. pp.Page(s):388 - 389,
⟨10.1109/TED.2007.902719⟩
Conference papers
hal-00319955v1
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Optically-Gated CNTFET compact model including source and drain Schottky barrier
Si-Yu Liao
,
Montassar Najari
,
Cristell Maneux
,
Sebastien Fregonese
,
Thomas Zimmer
et al.
5th Conference on Design and Technology of Integrated Systems in Nanoscale Era , Mar 2010, Hammamet, Tunisia. pp.1
Conference papers
hal-00584845v1
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A Scalable Model for Temperature Dependent Thermal Resistance of SiGe HBTs
Kumar Sahoo Amit
,
Sebastien Fregonese
,
Mario Weib
,
Cristell Maneux
,
Thomas Zimmer
et al.
IEEE Bipolar / BiCMOS Circuits and Technology Meeting , Sep 2013, Bordeaux, France
Conference papers
hal-00905673v1
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A Hicum SOI extension
Sébastien Fregonese
,
Gregory Avenier
,
Cristell Maneux
,
A. Chantre
,
Thomas Zimmer
et al.
5th European HICUM Workshop , 2005, France
Conference papers
hal-00181989v1
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Modélisation compacte du transistor à nanotube de carbone
Cristell Maneux
,
Johnny Goguet
,
Thomas Zimmer
Journées thématiques du Club EEA, Nanoélectronique , Mar 2006, France
Conference papers
hal-00181996v1
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Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors
Nathalie Labat
,
Nathalie Malbert
,
Cristell Maneux
,
Andre Touboul
Microelectronics Reliability , 2004, 44, pp.1
Journal articles
hal-00183088v1
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Experimental analysis and 2D simulation of AlGaAs/GaAs HBT base leakage current
Cristell Maneux
,
Nathalie Labat
,
Nathalie Saysset
,
Andre Touboul
,
Yves Danto
et al.
Microelectronics Reliability , 1997, 37, pp.1
Journal articles
hal-00183096v1
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Analysis of avalanche regime in InP HBT's using physical simulation - Implementation in a DC Model
Cristell Maneux
,
Jean-Christophe Martin
,
Nathalie Labat
,
Andre Touboul
,
Muriel Riet
et al.
International Conference on Industrial Technology , 2004, Tunisia. pp.1
Conference papers
hal-00183100v1
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Qualitative Assessment of Epitaxial Graphene FETs on SiC Substrates via Pulsed Measurements and Temperature Variation
Mukherjee Chhandak
,
Sebastien Fregonese
,
Thomas Zimmer
,
H. Happy
,
David Mele
et al.
Conference papers
hal-01090864v1
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TCAD modeling of NPN-SI-BJT electrical performance improvement through SiGe extrinsic stress layer
Al-Sadi Mahmoud
,
Sébastien Fregonese
,
Cristell Maneux
,
Thomas Zimmer
Journal articles
istex
hal-00671678v1
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Avalanche Compact model featuring SiGe HBTs Characteristics up to BVCBO
Mathieu Jaoul
,
Didier Céli
,
Cristell Maneux
HICUM Workshop 2017 , 2017, Dresden, Germany
Conference papers
hal-02511645v1
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0.4-µm InP/InGaAs DHBT with a 380-GHz fT > 600-GHz fMAX and BVCE0 > 4.5 V
Nil Davy
,
Virginie Nodjiadjim
,
Muriel Riet
,
Colin Mismer
,
Marina Deng
et al.
Conference papers
hal-03407761v1
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Why neuromorphic computing need novel 3D technologies? A view from FVLLMONTI European project consortium (Invited)
Cristell Maneux
,
Mukherjee Chhandak
,
Marina Deng
,
Maeva Dubourg
,
Lucas Réveil
et al.
High Performance Embedded Architecture and Compilation, Computing Systems Week, (HiPEAC CSW) Autumn 2021 , Oct 2021, Lyon, France
Conference papers
hal-03408071v1
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Circuit Design Flow dedicated to 3D vertical nanowire FET
Cristell Maneux
,
Mukherjee Chhandak
,
Marina Deng
,
Bruno Neckel Wesling
,
Lucas Réveil
et al.
Conference papers
hal-03765071v1
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CNTFET modeling and reconfigurable logic circuit design
Ian O'Connor
,
Junchen Liu
,
Frédéric Gaffiot
,
Fabien Prégaldiny
,
Cristell Maneux
et al.
Journal articles
hal-00187137v1
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An Accurate Physics-Based Compact Model for Dual-Gate Bilayer Graphene FETs
Jorge-Daniel Aguirre-Morales
,
Sebastien Fregonese
,
Chhandak Mukherjee
,
Cristell Maneux
,
Thomas Zimmer
et al.
Journal articles
hal-01235964v1
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A versatile compact model for ballistic 1D transistor: GNRFET and CNTFET comparison
Sebastien Fregonese
,
Cristell Maneux
,
Thomas Zimmer
Journal articles
hal-00512742v1
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Schottky barrier carbon nanotube transistor: Compact modeling, scaling study, and circuit design applications
Montassar Najari
,
Sebastien Fregonese
,
Cristell Maneux
,
H. Mnif
,
N. Masmoudi
et al.
Journal articles
hal-00584876v1
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Thermal aging model of InP/InGaAs/InP DHBT
S. Gosh
,
François Marc
,
Cristell Maneux
,
Brice Grandchamp
,
Gilles Amadou Koné
et al.
Journal articles
istex
hal-00674295v1
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TCAD setup for an advanced SiGe HBT technology applied to the HS, MV and HV transistor versions
Tommy Rosenbaum
,
Didier Céli
,
Michael Schröter
,
Cristell Maneux
Bipolar ArbeitsKreis , Nov 2016, München, Germany
Conference papers
hal-02511643v1
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Design of On-Wafer TRL Calibration Kit for InP Technologies Characterization up to 500 GHz
Marina Deng
,
Chhandak Mukherjee
,
Chandan Yadav
,
Sebastien Fregonese
,
Thomas Zimmer
et al.
Journal articles
hal-03088017v1
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Anything else beyond CMOS?
Sebastien Fregonese
,
Maneux Cristell
,
Zimmer Thomas
Atelier CNRS : " Nouveaux paradigmes de traitement de l'information " , May 2011, Paris, France
Conference papers
hal-00987253v1
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Scalable compact modeling of trap generation near the EB spacer oxide interface in SiGe HBTs
Marine Couret
,
Mathieu Jaoul
,
François Marc
,
Chhandak Mukherjee
,
Didier Celi
et al.
Journal articles
hal-02541991v1
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80 ns/45 GHz Pulsed measurement system for DC and RF characterization of high speed microwave devices
Mario Weib
,
Sébastien Fregonese
,
Marco Santorelli
,
Kumar Sahoo Amit
,
Cristell Maneux
et al.
Journal articles
hal-00909009v1
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Investigation on GaAs power MESFETs submitted to RF life-test by LF noise and drain current transient analysis
Nathalie Malbert
,
Benoit Lambert
,
Cristell Maneux
,
Nathalie Labat
,
Andre Touboul
et al.
IEEE GaAs Reliability Workshop , 1999, États-Unis. pp.1
Conference papers
hal-00183476v1
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Experimental analysis and 2D simulation of AlGaAs/GaAs HBT base leakage current
Cristell Maneux
,
Nathalie Labat
,
Nathalie Saysset
,
Andre Touboul
,
Yves Danto
et al.
ESREF'97 , 1997, France. pp.1
Conference papers
hal-00183483v1
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Experimental procedure for the evaluation of GaAs-based HBT's reliability
Cristell Maneux
,
Nathalie Labat
,
Nathalie Malbert
,
Andre Touboul
,
Yves Danto
et al.
Microelectronics Journal , 2001, 32, pp.1
Journal articles
hal-00183093v1
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Analysis of the surface base current drift in GaAs HBT's
Cristell Maneux
,
Nathalie Labat
,
Nathalie Saysset
,
Andre Touboul
,
Yves Danto
et al.
Microelectronics Reliability , 1996, 36, pp.1
Journal articles
hal-00183097v1
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InP based HBT reliability
Cristell Maneux
,
Nathalie Labat
,
Andre Touboul
,
Muriel Riet
,
Myrtil L. Kahn
et al.
Journées du GDR Nanoélectronique , 2004, France. pp.1
Conference papers
hal-00183101v1
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A compact model for SiGe HBT on thin film SOI
Sébastien Fregonese
,
Gregory Avenier
,
Cristell Maneux
,
A. Chantre
,
Thomas Zimmer
et al.
IEEE Transactions on Electron Devices , 2006, 53 (2), pp.296-303
Journal articles
hal-00181969v1
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