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Communication Dans Un Congrès Année : 1995

Thermal Transient Characterization of Electronic Assemblies by Infrared Thermography and DeltaVbemeter Methods

Résumé

The severe environment of electronic systems means that the design of electronic boards requires continual investigation, involving not only electronics but also thermal and thermomechanical studies.We present here two complementary experimetal methods to characterize the thermal transient behaviour of electronic assemblies and we compare the results obtained. Then, we conclude by presenting the fields of applications for such test equipments.

Domaines

Electronique
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Dates et versions

hal-00350049 , version 1 (05-01-2009)

Identifiants

  • HAL Id : hal-00350049 , version 1

Citer

Philippe Dondon, Eric Woirgard, Christian Zardini. Thermal Transient Characterization of Electronic Assemblies by Infrared Thermography and DeltaVbemeter Methods. 11th IEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUM, Feb 1995, San Jose, United States. pp.87-91. ⟨hal-00350049⟩
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