Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA - Laboratoire de l'intégration, du matériau au système TOUS LABOS Accéder directement au contenu
Article Dans Une Revue Microelectronics Reliability Année : 2022

Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA

Résumé

This article describes the development of a test bench so as to measure the ageing of 16 nm FinFETs used in a Zynq UltraScale+ FPGA from Xilinx. The Ring Oscillator (RO) drift measurement method was chosen and implemented in the setup. However, RO is a circuit sensitive not only to ageing but also to temperature and voltage. In order to mitigate the undesired sensitivity to temperature and voltage, we installed a regulation system to control the temperature and the internal voltage of the FPGA, and we characterised the RO frequency in function of the temperature and the voltage to apply post-measurement compensations. We improved the measurement circuit by using the GPS signal as a time reference. 1000 h test with (T$_{FPGA}$ = 100°C) and (V$_{FPGA}$ = V$_{nom}$ + 25%) was performed and results show clear RO frequency drifts lower than 0.1 % measured with an accuracy of 0.9 × 10−4.
Fichier principal
Vignette du fichier
Sobas2022.pdf (2.9 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-04017664 , version 1 (22-05-2024)

Identifiants

Citer

Justin Sobas, Tudor-Bogdan Airimitoaie, François Marc. Development of a high accuracy and stability test bench for ageing measurement of 16 nm FinFETs based FPGA. Microelectronics Reliability, 2022, 138, pp.114698. ⟨10.1016/j.microrel.2022.114698⟩. ⟨hal-04017664⟩
30 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Mastodon Facebook X LinkedIn More