Polarized Resonant Inelastic X-Ray Scattering as an Ultrafine Probe of Excited States of La2 CuO4 - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue Physical Review Letters Année : 2006

Polarized Resonant Inelastic X-Ray Scattering as an Ultrafine Probe of Excited States of La2 CuO4

Résumé

X-ray absorption is the standard method to probe the unoccupied density of states at a given edge. Here we show that polarized resonant inelastic x-ray scattering in La2 CuO4 at the Cu K edge is extremely sensitive to the environment of the Cu atom and the fine structure in the Cu 4p density of states. Combined ab initio and many-body cluster calculations, used for the first time in such a context, show remarkable agreement with experiment. In particular, we identify a nonlocal effect, namely, a transition to off-site Cu 3d states.

Dates et versions

hal-00128017 , version 1 (30-01-2007)

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Citer

Abhay Shukla, Matteo Calandra, Munetaka Taguchi, Akio Kotani, Gyorgy Vanko, et al.. Polarized Resonant Inelastic X-Ray Scattering as an Ultrafine Probe of Excited States of La2 CuO4. Physical Review Letters, 2006, 96, pp.077006. ⟨10.1103/PhysRevLett.96.077006⟩. ⟨hal-00128017⟩
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