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Article Dans Une Revue Applied Physics Letters Année : 2008

Reflow dynamics of thin viscous films

Résumé

This letter presents a study of viscous smoothening dynamics of a nanopatterned thin film. Ultrathin film manufacturing processes appearing to be a key point of nanotechnology engineering and numerous studies have been recently led in order to exhibit driving parameters of this transient surface motion, focusing on time scale accuracy method. Based on nanomechanical analysis, this letter shows that controlled shape measurements provided much more detailed information about reflow mechanism. Control of reflow process of any complex surface shape, or measurement of material parameter as thin film viscosity, free surface energy, or even Hamaker constant are therefore possible
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Dates et versions

hal-00383681 , version 1 (13-05-2009)

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Tanguy Lévéder, Stéfan Landis, Laurent Davoust. Reflow dynamics of thin viscous films. Applied Physics Letters, 2008, 92, pp.013107. ⟨10.1063/1.2828986⟩. ⟨hal-00383681⟩
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