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Communication Dans Un Congrès Année : 2009

AFM and Raman Studies of Graphene Exfoliated on SiC

Résumé

We report an investigation of few layers graphene exfoliated on SiC. Using AFM and Raman spectroscopy, we find that the graphene thickness determined from the normalized intensity of Raman lines significantly depart from the one obtained using XPS.
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Dates et versions

hal-00411935 , version 1 (31-08-2009)

Identifiants

  • HAL Id : hal-00411935 , version 1

Citer

Antoine Tiberj, Marta Martin-Fernandez, Nicolas Camara, P. Poncharal, T. Michel, et al.. AFM and Raman Studies of Graphene Exfoliated on SiC. 7th European Conference on Silicon Carbide and Related Materials, Sep 2008, Barcelona (SPAIN), Spain. pp.215-218. ⟨hal-00411935⟩
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