Potentialities and limitations of an electro-optic probe for electric field diagnostics of cold atmospheric pressure plasma jets - IMEP-LAHC - Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation
Article Dans Une Revue The European Physical Journal D : Atomic, molecular, optical and plasma physics Année : 2023

Potentialities and limitations of an electro-optic probe for electric field diagnostics of cold atmospheric pressure plasma jets

Résumé

This paper focuses on the use of an electro-optic (EO) probe for the spatially and temporally resolved characterization of the electric field (E-field) associated with guided ionization waves-or guided streamers-propagating at atmospheric pressure. An AC high-voltage power supply (6 kV at 18 kHz) is used to generate guided ionization waves in helium with a cold atmospheric pressure plasma jet device (APPJ). The capabilities of this electro-optic technique are investigated with and without the discharge. This innovative technology will use to carry out the optical polarimetric analysis of the APPJ with simultaneous real-time measurement of longitudinal and radial components of the electric field vector. Last but not least, an application-based case study of the ionization waves propagating and interacting with the EO probebeing a solid dielectric target-is also reported. The results will bring realistic information on the potential perturbation induced by the EO probe itself on the E-field characterization at the macroscopic scale.
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Commentaire Accepted version of the manuscript published with the doi 10.1140/epjd/s10053-023-00781-8.

Dates et versions

hal-04292090 , version 1 (17-11-2023)

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Farah Aljammal, Gwenaël Gaborit, Sylvain Iséni, Maxime Bernier, Guillaume Chevrier-Gros, et al.. Potentialities and limitations of an electro-optic probe for electric field diagnostics of cold atmospheric pressure plasma jets. The European Physical Journal D : Atomic, molecular, optical and plasma physics, 2023, Low Temperature Plasmas: Processes and Diagnostics for Future Applications, 77 (11), pp.199. ⟨10.1140/epjd/s10053-023-00781-8⟩. ⟨hal-04292090⟩
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