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Communication Dans Un Congrès Année : 2018

Kossel diffraction combined to proton induced x-ray emission for the study of multilayers of nanometer thickness

Résumé

When the atoms of a periodic structure emit some characteristic radiation, this radiation can be diffracted by the structure itself. This is Kossel diffraction. The characteristic radiation can be generated either by an electron, ion or x-ray beam. Here we will present some examples regarding the proton excitation of periodic multilayers made of very thin layers, in the range of the nanometer thickness. We shall discuss the PIXE-Kossel technique in relationship to other methods based on the combination of xray standing waves with x-ray fluorescence or x-ray photoelectron spectroscopies. We shall also discuss the study of periodic multilayers in comparison to stacks of thin films acting as planar x-ray waveguides.
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Dates et versions

hal-03933279 , version 1 (01-02-2023)

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  • HAL Id : hal-03933279 , version 1

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Philippe Jonnard. Kossel diffraction combined to proton induced x-ray emission for the study of multilayers of nanometer thickness. Seminar of the Department of Material Science and Engineering, Jiangsu University of Science and Technology, Jul 2018, Zhenjiang, China. ⟨hal-03933279⟩
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