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Communication Dans Un Congrès Année : 2009

An inverse ellipsometric problem for thin film characterization: Comparison of different optimization methods.

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hal-00385120 , version 1 (18-05-2009)

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  • HAL Id : hal-00385120 , version 1

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Ayse Akbalik, D. Fuard, P. Schiavone, J.H. Tortai, I. Kone, et al.. An inverse ellipsometric problem for thin film characterization: Comparison of different optimization methods.. SPIE 2009, 2009, United States. pp.2009. ⟨hal-00385120⟩
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