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Article Dans Une Revue Solid-State Electronics Année : 2013

80 ns/45 GHz Pulsed measurement system for DC and RF characterization of high speed microwave devices

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hal-00909009 , version 1 (25-11-2013)

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Mario Weib, Sébastien Fregonese, Marco Santorelli, Kumar Sahoo Amit, Cristell Maneux, et al.. 80 ns/45 GHz Pulsed measurement system for DC and RF characterization of high speed microwave devices. Solid-State Electronics, 2013, 84, pp.74-82. ⟨10.1016/j.sse.2013.02.027⟩. ⟨hal-00909009⟩
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