In this paper, the optical properties and the growth mechanism of Au/SiO 2 metal-insulator films (MIFs) are investigated by combining ellipsometry and transmission electron microscopy. The ellipsometric measurements, analyzed by using effective medium theories, show that the growth mechanism involves a Volmer-Weber growth mode while the morphology and the optical properties of Au/SiO 2 MIFs are directly related to the percolation of the Au nanostructures. Indeed, below the percolation threshold of Au, the MIFs consist of ellipsoidal Au inclusions embedded in a SiO 2 matrix. These insulating films present anisotropic plasmonic properties, attributed to the asymmet-ric interactions between nanaoparticles (NPs), which can be modeled according to the interacted shape distributed nanoparticle effective medium theory. At the percolation threshold of Au, an insulator-to-metal transition is observed. The MIFs simultaneously exhibit plasmonic and metallic optical properties, which can be described by the Bruggeman theory. The density of free electrons increases and the MIFs become more and more conductive as the Au volume fraction increases. We also demonstrate that for a high Au volume fraction, Bruggeman and Maxwell Garnett theories converge toward the same results, suggesting that the film is composed of isolated SiO 2 inclusion embedded in a gold matrix.