Etude expérimentale et numérique de la réponse OCVD (Open-Circuit Voltage Decay) de jonctions à base de GaAs
Origin | Files produced by the author(s) |
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Licence |
Origin | Files produced by the author(s) |
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Licence |
Alain Dollet : Connect in order to contact the contributor
https://cnrs.hal.science/hal-04268493
Submitted on : Friday, November 3, 2023-11:35:13 AM
Last modification on : Tuesday, October 1, 2024-10:02:50 AM
Long-term archiving on : Sunday, February 4, 2024-6:05:40 PM