Journal Articles European Physical Journal: Applied Physics Year : 2024

Characterisation of barium hexaferrite thin films in microwave frequency band

Abstract

The characterization of barium hexaferrite thin-films at microwave frequencies is important for determining their electromagnetic properties by measuring the elements of the permeability tensor. Layers of 15 µm were deposited by RF sputtering on a coplanar line. As a result of this deposition and annealing technique, the magnetic moments are mainly oriented in the plane of the layer. By measuring the S parameters under magnetic field conditions, the µ and κ elements of the permeability tensor were extracted and their variations as a function of the applied field were highlighted. Possible applications to absorbent layers are being considered.
Fichier principal
Vignette du fichier
ap240087(2).pdf (1.31 Mo) Télécharger le fichier
Origin Files produced by the author(s)

Dates and versions

hal-04796629 , version 1 (21-11-2024)

Licence

Identifiers

Cite

Didier Vincent. Characterisation of barium hexaferrite thin films in microwave frequency band. European Physical Journal: Applied Physics, 2024, 99, pp.21. ⟨10.1051/epjap/2024240087⟩. ⟨hal-04796629⟩
25 View
11 Download

Altmetric

Share

More