Article Dans Une Revue European Physical Journal: Applied Physics Année : 2024

Characterisation of barium hexaferrite thin films in microwave frequency band

Résumé

The characterization of barium hexaferrite thin-films at microwave frequencies is important for determining their electromagnetic properties by measuring the elements of the permeability tensor. Layers of 15 µm were deposited by RF sputtering on a coplanar line. As a result of this deposition and annealing technique, the magnetic moments are mainly oriented in the plane of the layer. By measuring the S parameters under magnetic field conditions, the µ and κ elements of the permeability tensor were extracted and their variations as a function of the applied field were highlighted. Possible applications to absorbent layers are being considered.
Fichier principal
Vignette du fichier
ap240087(2).pdf (1.31 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-04796629 , version 1 (21-11-2024)

Licence

Identifiants

Citer

Didier Vincent. Characterisation of barium hexaferrite thin films in microwave frequency band. European Physical Journal: Applied Physics, 2024, 99, pp.21. ⟨10.1051/epjap/2024240087⟩. ⟨hal-04796629⟩
28 Consultations
11 Téléchargements

Altmetric

Partager

More