Article Dans Une Revue IEEE Transactions on Instrumentation and Measurement Année : 2024

Autonomous Bearing Fault Diagnosis Based on Fault-Induced Envelope Spectrum and Moving Peaks-Over-Threshold Approach

Ge Xin
Qitian Zhong
Yaqiang Jin
Zhe Li
Yifei Chen
Yan-Fu Li
Jérôme Antoni
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hal-04915077 , version 1 (27-01-2025)

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Ge Xin, Qitian Zhong, Yaqiang Jin, Zhe Li, Yifei Chen, et al.. Autonomous Bearing Fault Diagnosis Based on Fault-Induced Envelope Spectrum and Moving Peaks-Over-Threshold Approach. IEEE Transactions on Instrumentation and Measurement, 2024, 73, pp.1-12. ⟨10.1109/TIM.2024.3379074⟩. ⟨hal-04915077⟩
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