Metrology of low absorption and photo-induced effects at 1.1 and 1.5 μm with Lock-in Thermography and phase imaging techniques
Résumé
This study quantifies absorption and wavefront deformations in optical thin films using Lock-in Thermography (LIT) and phase imaging techniques. A finite element model simulates thermo-mechanical effects, providing insights to optimize high-power laser system performance and reliability.
