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https://cnrs.hal.science/hal-03477595
Submitted on : Monday, December 13, 2021-2:51:49 PM
Last modification on : Friday, March 24, 2023-2:53:24 PM
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- HAL Id : hal-03477595 , version 1
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Min Zhai, A. Locquet, David S. Citrin. The individual thickness characterization of stacked sample by terahertz imaging. 11th THz young scientist meeting, Mar 2020, Marburg, Germany. ⟨hal-03477595⟩
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