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Journal Articles Solid-State Electronics Year : 2022

Modelling of self-heating effect in FDSOI and bulk MOSFETs operated in deep cryogenic conditions

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hal-03852787 , version 1 (28-11-2022)

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Gérard Ghibaudo, M. Cassé, F. Serra Di Santa Maria, C. Theodorou, Francis Balestra. Modelling of self-heating effect in FDSOI and bulk MOSFETs operated in deep cryogenic conditions. Solid-State Electronics, 2022, ⟨10.1016/j.sse.2022.108265⟩. ⟨hal-03852787⟩
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