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Article Dans Une Revue IEEE Transactions on Components Packaging and Manufacturing Technology Part B Année : 2017

Modeling and Frequency Performance Analysis of Through Silicon Capacitors in Silicon Interposers

Alexis Farcy
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Résumé

The feasibility of cointegration of new capacitors, named “through silicon capacitors” (TSCs) with “through silicon vias” in silicon interposers has recently been demonstrated. Two architectures of TSC are extensively investigated in this paper: “axial TSC” whose electrodes are connected on either sides of the silicon interposer and “radial TSC” with electrodes both connected to the metal layers of the back end of line. A general modeling method based on distributed cell segmentation is proposed for both architectures. Validation is performed by measurements from 1 kHz to 40 GHz (above the resonance frequency of the components). A comparative study between radial and axial architectures is performed, leading to the prediction of the performances of those new components. Finally, design rules are established for future integration for power delivery networks decoupling applications.
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Dates et versions

hal-01819186 , version 1 (20-06-2018)

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Khadim Dieng, Philippe Artillan, Cédric Bermond, Olivier Guiller, Thierry Lacrevaz, et al.. Modeling and Frequency Performance Analysis of Through Silicon Capacitors in Silicon Interposers. IEEE Transactions on Components Packaging and Manufacturing Technology Part B, 2017, 7 (4), pp.477 - 484. ⟨10.1109/TCPMT.2017.2655939⟩. ⟨hal-01819186⟩
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