Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron–ion imaging - CNRS - Centre national de la recherche scientifique Accéder directement au contenu
Article Dans Une Revue Journal of Physics B: Atomic, Molecular and Optical Physics Année : 2020

Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron–ion imaging

Résumé

After decades of supremacy of the Titanium:Sapphire technology, Ytterbium-based high-order harmonic sources are emerging as a promising alternative for experiments requiring high flux of ultrashort extreme ultraviolet (XUV) radiation. In this article we describe a versatile experimental setup delivering XUV photons in the 10–50 eV range. The use of cascaded high-order harmonic generation enables us to reach 1.9 mW of average power at 18 eV. Several spectral selection schemes are presented, to isolate a single high-harmonic or a group of them. In the perspective of circular dichroism experiments, we produce highly elliptical XUV radiation using resonant elliptical high-harmonic generation, and circularly polarized XUV by bichromatic bicircular high-harmonic generation. As an illustration of the capacities of the beamline, we focus the XUV beam in a coincidence electron–ion imaging spectrometer, where we measure the photoelectron momentum angular distributions of xenon monomers and dimers
Fichier principal
Vignette du fichier
2006.06297 (1.83 Mo) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)

Dates et versions

hal-03005114 , version 1 (14-12-2023)

Identifiants

Citer

A Comby, E Bloch, S Beauvarlet, D Rajak, S Beaulieu, et al.. Bright, polarization-tunable high repetition rate extreme ultraviolet beamline for coincidence electron–ion imaging. Journal of Physics B: Atomic, Molecular and Optical Physics, 2020, 53 (23), pp.234003. ⟨10.1088/1361-6455/abbe27⟩. ⟨hal-03005114⟩
47 Consultations
3 Téléchargements

Altmetric

Partager

Gmail Mastodon Facebook X LinkedIn More